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Nguyen, P. L.; Daido, Hiroyuki; Matsunaga, Yukihiro; Hanari, Toshihide; Terada, Takaya; Yamada, Tomonori; Kawachi, Tetsuya
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Uozumi, Yuki; Asaoka, Hidehito
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We have succeeded in measurements of the surface stress in Si(111) as a function of 77 reconstruction by comparison with the H-terminated Si(111) 11 surface. In order to obtain information on both the surface stress and the surface reconstruction simultaneously, we havecombined the surface-curvature and the reflection-high-electron-energy-diffraction instrumentations in an identical ultrahigh vacuum system. The stress evolution shows a decrease of tensile stresscorresponding to the formation of H-termination at the beginning of the atomic hydrogen exposure of Si(111) 77 surface. After the above treatment, a complete transformation of the surface structure occurs from the reconstructed surface to the 11 one. As a result, we find the Si(111) 11 surface releases 1.7 N/m (=J/m), or (1.4 eV/(11 unit cell)), of the surface energy from the strong tensile Si(111) 77 reconstruction.
Tsubouchi, Masaaki; Nagashima, Keisuke; Yoshida, Fumiko; Ochi, Yoshihiro; Maruyama, Momoko
no journal, ,
We have developed the Febry-Perot type contact grating device for intense THz generation. In this device, the grating to tilt the pulse front of the pump pulse is contacted on the LiNbO crystal. To realize the contact grating device, we employed the Febry-Perot cavity on the LiNbO crystal to obtain the high diffraction ratio of the grating. In this paper, we introduce the characteristic of the device, and discuss the intrinsic problems and its solutions.
Yoshigoe, Akitaka; Shiwaku, Hideaki; Kobayashi, Toru; Shimoyama, Iwao; Matsumura, Daiju; Tsuji, Takuya; Nishihata, Yasuo; Yaita, Tsuyoshi; Kogure, Toshihiro*; Motai, Satoko*; et al.
no journal, ,
Fundamental researches on adsorption state of radiaoactive Cs in clay mineral (aluminosilicate) have become important from the virewpoints of development of decontamination or volume-reduction techniques since the accident of Fukushima Daiiichi Nuclear Power Station. Pinpoint surface chemical analysis with nanometer spatial resolutions focusing on a target sample has been needed. In this presentation, I will show our recent work on nanoscale pinpoint surface chemical analysis for Cs-containing clay mineral by means of synchrotron radiation PEEM at BL17SU in SPring-8.
Koike, Masato; Nagano, Tetsuya*
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Boron (B) in the steel material can greatly contribute to the improvement of the quenching property by the addition in a few tens ppm level. Taking this advantage the automotive steel sheets becomes possible lighter remains maintained strength. However, in the steelmaking process, accurate control of the B addition quantity in ppm level is needed. Also there is a strong demand for detailed electronic structure analysis for boron compounds. The authors have found a unique method based on a new physical phenomenon, which can dramatically increase the diffraction efficiency of the laminar type diffraction grating coated with a metal single-layer film such as gold around B-K emission line (6.76 nm). This phenomenon, in the grazing incidence area where causes the total reflection, can be appeared by overcoating with a transparent and high density layer having a certain thickness on the metal coated grating grooves. For the overcoating layer, it is desirable to have an intermediate refractive index in vacuum and the metal layer. From this standpoint we did a search on the oxide films which are generally used as optical coating. Consequently, TiO, CeO, etc., were found to be promising candidates to meet this criterion. The results of numerical calculation shows that the diffraction efficiency of both TiO and CeO is 22% at 6.76 nm and it is a significant improvement from 15.6% and 14.1% for Ni and Au, respectively.
Suzui, Nobuo
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no abstracts in English
Fujita, Masaya*; Asaoka, Hidehito; Yamaguchi, Kenji
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The ion beam sputter deposition method is capable of fabricating highly-oriented ErO thin film on crystalline Si substrate at 700 C, by bombarding ErO target with O ion beam. However, there always exists silicide phase (ErSi) due to direct reaction between sputtered Er atoms and the Si substrate. In order to find ways to prevent, or slow down the reaction of Si with Er, the dependence of the sputter-etching conditions of the substrate, which are conducted prior to deposition to remove surface impurities, on the film crystalline properties was investigated. In the experiment, two sputter-etching conditions, (a) fluence 3.710 ions cm (normally employed condition) and (b) 3.710 ions cm, were employed. The results of the film structure observed by XRD analysis indicated that the silicide phase was present irrespective of the fluence conditions employed.
Okada, Michio*; Tsuda, Yasutaka*; Teraoka, Yuden; Yoshigoe, Akitaka
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Cu and its nanostructure are important for application of future nanoelectrode and solar cell. The study of Cu surface oxidation as a corrosion process is required to develop advanced material with high properties for corrosion resistance. In this conference, the study on alloying effects in the ultrathin oxide film formation on CuAu alloy surface and bulk Au concentration dependence are presented.
Sato, Shinichiro; Schmieder, K.*; Hubbard, S.*; Forbes, D.*; Warner, J.*; Oshima, Takeshi; Walters, R.*
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III-V semiconductor devices embedded with quantum dots (QDs) are expected to be applied to next generation space solar cells. High density QDs and highly stacked QD layers without stacking fault are required in order to relaize QD solar cells, and have been obtained recently by using strain compensating technology. However, larger amount of defects are still incorporated into QD devices compared to single crystal devices and affect the device characteristics. In this study, we fabricated GaAs pn diode with 10 layers of InAs QDs by Metal Organic Vapor Phase Epitaxy (MOVPE) method and characterized defect levels in the devices using Deel Level Transient Spectroscopy (DLTS). The results were compared to reference samples which were GaAs pn diodes without InAs QDs. It was shown that unique electron and hole trap levels were found in the QD devices and thus we concluded that these traps should be reduced in order to improve the device quality.
Matsuda, Takuma; Yokoseki, Takashi; Mitomo, Satoshi; Murata, Koichi; Makino, Takahiro; Takeyama, Akinori; Onoda, Shinobu; Okubo, Shuichi*; Tanaka, Yuki*; Kandori, Mikio*; et al.
no journal, ,
Silicon carbide (SiC) is expected to be applied to Metal-Oxide-Semiconductor (MOS) FETs used in harsh radiation environments to decommission TEPCO Fukushima Daiichi nuclear reactors. To develop radiation resistant SiC MOS FETs, clarification of their radiation response under elevated temperature is required. We measured capacitance-voltage (C-V) characteristics of SiC MOSFETs irradiated with -rays at 423 K in nitrogen atmosphere. The samples were vertical power 4H-SiC MOSFETs with the blocking voltage of 1200 V and the rated current of 20 A with the gate oxide thickness of 45 nm. Typical C-V curve of a SiC MOSFET irradiated even up to 5 kGy was shifted to negative voltage side, suggesting that the positive charges generated in gate oxide by irradiation. While, no significant change in the slope of the curve was observed, indicating that interface traps between the gate oxide and SiC were merely generated. The radiation response of SiC MOS FETs under elevated temperature predominantly depends on the amount of positive charges generated in the gate oxide.
Entani, Shiro; Honda, Mitsunori; Takizawa, Masaru*; Shimoyama, Iwao; Naramoto, Hiroshi*; Sakai, Seiji; Shamoto, Shinichi
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no abstracts in English
Sasaki, Takuo; Deki, Ryota; Takahashi, Masamitsu
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no abstracts in English
Takahashi, Masamitsu; Sasaki, Takuo; Deki, Ryota*
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no abstracts in English
Sakai, Takuro; Yasuda, Ryo; Iikura, Hiroshi; Matsubayashi, Masahito
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no abstracts in English
Deki, Ryota*; Sasaki, Takuo; Takahashi, Masamitsu
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no abstracts in English
Kono, Nanase; Itakura, Ryuji; Tsubouchi, Masaaki
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We realize a relativistic Doppler reflection of terahertz (THz) light from a counter propagating photo-induced carrier in silicon (Si). We have observed the Doppler reflection of THz light at some different pump light intensity. The up-shift frequency was increasing with pump intensity, and becoming a constant at high pump intensity. We have defined a new parameter, effective carrier thickness, and discussed the interaction between the photo induced carriers and THz light.
Kanasaki, Masato*; Jinno, Satoshi*; Sakaki, Hironao; Kondo, Kiminori; Oda, Keiji*; Yamauchi, Tomoya*; Fukuda, Yuji
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In laser-driven ion acceleration experiments using cluster-gas targets, a significant amount of fast electrons are produced that drive ion acceleration along with high energy ions with several-tens of MeV. In our recent experiment, the energy of the electrons reached as high as 200 MeV. Such fast electrons can produce photo-neutrons by bremsstrahlung processes followed by (, ) reactions. When the CR-39 nuclear track detector is exposed to such photo-neutrons, it records the etchable tracks of recoiled protons depending on their energy as unwanted background signals. To precisely diagnose laser-accelerated protons using CR-39, we have developed the discrimination method for laser- accelerated protons and photo-neutrons on CR-39 based on the incident angle and the incident energy.
Sasaki, Akira; Sunahara, Atsushi*; Nishihara, Katsunobu*
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no abstracts in English
Kimata, Tetsuya*; Kato, Sho*; Yamaki, Tetsuya; Yamamoto, Shunya; Hakoda, Teruyuki; Kobayashi, Tomohiro*; Terai, Takayuki*
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Platinum (Pt) nanoparticles with high oxygen reduction reaction activity have been required for applications to polymer electrolyte fuel cells. We prepared the Pt nanoparticles on an Ar-ion-irradiated glassy carbon (GC) substrate by a radio-frequency sputtering method to investigate the influence of the ion-induced lattice defects in GC on the deposited Pt nanoparticles by X-ray photoelectron spectroscopy (XPS). Detailed examination of both the Pt 4f and C 1s XPS spectra demonstrated that Pt-C bonding interaction occurred at the interface between the irradiated GC and Pt nanoparticles, confirming the significant effect of the Ar-ion irradiation on the electronic properties of Pt.
Sakai, Seiji; Majumdar, S.*; Entani, Shiro; Avramov, P.*; Fukaya, Yuki; Naramoto, Hiroshi*; Yamauchi, Yasushi*
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no abstracts in English
Tsuda, Yasutaka*; Makino, Takamasa*; Okada, Michio*; Yoshigoe, Akitaka; Teraoka, Yuden
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Oxidation processes of alloy materials are important chemical reactions for the fabrication of protective layers used in various industrial applications. In this study, surface temperature dependence of oxidation of CuAu(111) was studied using synchrotron radiation XPS and molecular beams. It was found that no dependence among uptake curves was observed from 300 to 500 K in low oxygen dosage because a direct dissociative adsorption takes place in this incident energy region. In contrast, clear difference between 400 and 500 K due to CuO formation was observed. This result suggests that thermal-driven diffusion of Au atoms into bulk depress the protective function for oxidation.